Simulation of Irradiation and Temperature Efficiency of Thin Film and Crystalline Silicon Modules Based on Different Parametrization

For reliable energy yield predictions an accurate modeling of the PV module behavior is essential. In this analysis we compare two different possibilities for acquiring the necessary parameters: indoor measurements and data sheet values. We found that temperature coefficients of power given in data sheets can be used for yield prediction without introducing higher uncertainties. On the other hand the derivation of model parameters for the modeling of irradiation dependent efficiency of PV modules based on data sheets is associated with high uncertainties. In a sample of 50 PV modules only for 15 modules parameters from data sheets could be derived with a sufficient accuracy.