New method to determine diffusion coefficients and surface rate constants in mixed ionic electronic conductors

A new math. method to est. diffusion coeffs. (D) and surface rate consts. (k) in mixed ionic electronic conductors has been developed. The so-called intersection line method neglects the dependency of D and k pairs on initial values like classical optimization programs do. The important advantages of the new developed method against classical optimization procedures in terms of independence of initial values and precision by finding the phys. meaningful soln. have been shown.