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  4. Mo/Si multilayers with different barrier layers for applications as EUV mirrors
 
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2001
Conference Paper
Titel

Mo/Si multilayers with different barrier layers for applications as EUV mirrors

Abstract
Summary form only given. Pulsed laser deposition (PLD) and magnetron sputter deposition have been used to prepare different types of Mo/Si multilayers for the EUV spectral range, First of all, the pure Mo/Si system without any additional components has been investigated. The different growth mechanisms of the layers induced by the alternative deposition methods are discussed and the resulting reflectivities and microstructures are compared. Various materials (e.g. C, B(sub 4)C, Ag, W) were tested as barrier layers at the Mo-Si interface. We have investigated their influence on reflectivity and morphology of the resulting multilayer structures.
Author(s)
Braun, S.
Mai, H.
Moss, M.
Scholz, R.
Hauptwerk
Microprocesses and nanotechnology 2001. Digest of papers
Konferenz
International Microprocesses and Nanotechnology Conference (MNC) 2001
Thumbnail Image
DOI
10.1109/IMNC.2001.984103
Language
English
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Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Tags
  • diffusion barriers

  • interface structure

  • mirrors

  • molybdenum

  • optical multilayers

  • pulsed laser depositi...

  • reflectivity

  • silicon

  • sputter deposition

  • ultraviolet spectra

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