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2005
Conference Paper
Title
Test patterns with TTCN-3
Abstract
Patterns are used in various engineering disciplines to represent common aspects of a set of solutions to a (set of) common problem(s). This paper discusses main concepts of test patterns, provides a characterization of test patterns and describes the use of test patterns in the test development process. Test patterns can be used to support the vertical reuse between different testing phases and testing kinds, horizontal reuse between different product version and historical reuse between different product versions. Specification means for test patterns will be analysed and compared with the language features of the Testing and Test Control Notation (TTCN-3)