2006
Conference Proceeding
Title

Pattern recognition : 28th DAGM Symposium. Proceedings

Title Supplement
Berlin, Germany, September 12-14, 2006
Person Involved
Franke, K.
Müller, K.R.
Nickolay, B.
Schäfer, R.
Corporate Author
Deutsche Arbeitsgemeinschaft für Mustererkennung -DAGM-
Publisher
Publishing Place
Berlin
Conference
Language
English
FIRST