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Distortion measurements on pure-silicon and siliconplastic X-ray masks
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1981
Conference Paper
Title
Distortion measurements on pure-silicon and siliconplastic X-ray masks
Other Title
Verzugsmessungen an Reinsiliziummasken und Silizium-Plastikmasken fuer die Roentgenlithographie
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Author(s)
Triantafyllou, M.
Betz, H.
Heuberger, A.
Tischer, P.
Mainwork
Microcircuit Engineering 81. Proceedings of the International Conference on Microlithography
Conference
International Conference on Microlithography 1981
Language
English
IFT
Keyword(s)
Lithographie
Lithographiemaske
Maskenverzerrung
Röntgenstrahlen
Silizium