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  4. New approach for monitoring a direct laser interference patterning process using a combination of an infrared camera and a diffraction measurement system
 
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2021
Journal Article
Title

New approach for monitoring a direct laser interference patterning process using a combination of an infrared camera and a diffraction measurement system

Abstract
Recently, process monitoring emerges as a breakthrough technology in industrial laser machines applications to enhance process stability and economic efficiency while ensuring high-quality processing parts and significantly reducing scrap rate. Furthermore, the latest advances in monitoring systems open a broad range of new opportunities to increase the capabilities of laser surface structuring. In this study, stainless steel and aluminum substrates are structured with a line-like geometry by Direct Laser Interference Patterning. A high-speed infrared camera is used to detect the thermal effects throughout the laser process. Simultaneously, a diffraction measurement system is implemented to analyze the quality of the fabricated periodic patterns by comparing the diffraction order characteristics. This specific combination of the systems allows a remarkably high-performance process monitoring and quality assurance. The obtained results reveal a correlation between the signals detected by the infrared camera and the intensity of the diffraction orders recorded with the quality of the surface reached.
Author(s)
Schröder, Nikolai
TU Dresden
Teutoburg-Weiss, Sascha
TU Dresden
Vergara, Germán
New Infrared Technologies
Lasagni, Andrés-Fabián  
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Journal
Journal of Laser Micro/Nanoengineering. Online journal  
Project(s)
LAMPAS
Funder
European Commission  
Open Access
DOI
10.2961/jlmn.2021.02.2009
Additional link
Full text
Language
English
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Keyword(s)
  • direct laser interference patterning

  • DLIP

  • pulsed laser

  • stainless steel

  • aluminum

  • monitoring

  • heat accumulation

  • infrared camera

  • diffraction

  • scatterom

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