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  4. Data-driven methods for fault localization in process technology
 
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2013
Doctoral Thesis
Title

Data-driven methods for fault localization in process technology

Abstract
Control systems at production plants consist of a large number of process variables. When detecting abnormal behavior, these variables generate an alarm. Due to the interconnection of the plant's devices the fault can lead to an alarm flood. This again hides the original location of the causing device. In this work several data-driven approaches for root cause localization are proposed, compared and combined. All methods analyze disturbed process data for backtracking the propagation path.
Thesis Note
Zugl.: Karlsruhe, Inst. für Technologie (KIT), Diss., 2013
Author(s)
Kühnert, Christian  
Publisher
KIT Scientific Publishing  
Publishing Place
Karlsruhe
File(s)
Download (6.14 MB)
Rights
Use according to copyright law
DOI
10.24406/publica-fhg-279833
Language
English
Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB  
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