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  4. System-level-model development of an SWCNT based piezoresistive sensor in VHDL-AMS
 
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2014
Conference Paper
Title

System-level-model development of an SWCNT based piezoresistive sensor in VHDL-AMS

Abstract
This article deals with the model development for a single walled carbon nanotube (SWCNT) piezoresistive sensor at system level design. The framework of VHDL-AMS is used for implementation and simulation, consisting of compact submodels that describe components performing heterogeneous functions. The SWCNT mechanical and electrical compact models presented in the article are based on the analytical model, lumped element model and the simulation results based on density functional theory (DFT). The macromodels of the MEMS are built using a reduced order modeling technique based on finite element simulations. This article presents and discusses the most important aspects of the development of system models and essential model parameters.
Author(s)
Kolchuzhin, V.
Mehner, J.
Markert, E.
Heinkel, Ulrich
Wagner, Christian Friedemann  orcid-logo
Schuster, Jörg  
Geßner, Thomas  
Mainwork
15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2014  
Conference
International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) 2014  
DOI
10.1109/EuroSimE.2014.6813846
Language
English
Fraunhofer-Institut für Elektronische Nanosysteme ENAS  
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