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  4. A novel reconfigurable RF switch based on ferroelectric hafnium oxide FeFET fabricated in 22 nm FDSOI technology
 
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2023
Conference Paper
Title

A novel reconfigurable RF switch based on ferroelectric hafnium oxide FeFET fabricated in 22 nm FDSOI technology

Abstract
This paper presents a novel type of ferroelectric field effect transistor (FeFET)-based RF switch with multiple finger structure fabricated in 22 ~nm FDSOI technology. The ability to adjust the threshold voltage non-volatile allows for a novel switch concept. The FeFET can operate at V_GS=\mathbf0, which reduces the necessity of bias-Tee configurations in the signal path. It combines the advantages of passive and active RF switches with low loss and low distortion. The devices were implemented in the common-source configuration and demonstrate a large memory window exceeding 2 ~V, as well as exceptional performance at mmWave frequencies. We determined a transit frequency \left(f_T\right) and maximum oscillation frequency (f_MAX) of 135GHz and 139GHz, respectively for a device with 16 fingers, 20 ~nm gate length, and 1 \mu m gate width.
Author(s)
Abdulazhanov, Sukhrob
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Huynh, Dang Khoa
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Le, Quanghuy
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Kämpfe, Thomas  orcid-logo
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Gerlach, Gerald
Technische Universität Dresden
Mainwork
2023 18th European Microwave Integrated Circuits Conference Eumic 2023
Funder
Horizon 2020 Framework Programme
Conference
18th European Microwave Integrated Circuits Conference, EuMIC 2023
DOI
10.23919/EuMIC58042.2023.10288652
Language
English
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Keyword(s)
  • FDSOI

  • FeFET

  • ferroelectric

  • HfO2

  • HVT

  • LVT

  • memory window

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