• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Artikel
  4. Machine Learning Application for Prediction of Sapphire Crystals Defects
 
  • Details
  • Full
Options
2020
Journal Article
Title

Machine Learning Application for Prediction of Sapphire Crystals Defects

Abstract
We investigate the impact of different numbers of positive and negative examples on machine learning for sapphire crystals defects prediction. We obtain the models of crystal growth parameters influence on the sapphire crystal growth. For example, these models allow predicting the defects that occur due to local overcooling of crucible walls in the thermal node leading to the accelerated crystal growth. We also develop the prediction models for obtained crystal weight, blocks, cracks, bubbles formation, and total defect characteristics. The models were trained on all data sets and later tested for generalization on testing sets, which did not overlap the training set. During training and testing, we find the recall, precision of prediction and analyze the correlation among the features. The results have shown that the precision of neural network method for predicting defects formed by local overcooling of the crucible reached 0.94.
Author(s)
Klunnikova, Yulia Vladimirovna
Institute of Nanotechnology, Electronics and Engineering Equipment, Southern Federal University of Russia, Taganrog
Anikeev, Maxim Vladimirovich
Fraunhofer-Institut für Sichere Informationstechnologie SIT  
Filimonov, Alexey Vladimirovich
Department of Physical Electronics, Peter the Great St. Petersburg Polytechnic University, St. Petersburg
Kumar, Ravi
Department of Metallurgical and Materials Engineering, Indian Institute of Technology Madras, Chennai
Journal
Journal of electronic science and technology : JEST  
Open Access
DOI
10.1016/j.jnlest.2020.100029
Additional full text version
Landing Page
Language
English
Fraunhofer-Institut für Sichere Informationstechnologie SIT  
Keyword(s)
  • defects

  • machine learning

  • sapphire crystals

  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024