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  4. Benchmarking of large-area GaN-on-Si HFET power devices for highly-efficient, fast-switching converter applications
 
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2013
Conference Paper
Title

Benchmarking of large-area GaN-on-Si HFET power devices for highly-efficient, fast-switching converter applications

Abstract
This work reports the development and fabrication of large area AlGaN/GaN-on-Si HFETs for the use in highly-efficient, fast-switching power converters. High performance is demonstrated by full characterization of static- and dynamic-parameters and a direct comparison to two commercial state-of-the-art silicon power devices. Compared to their silicon counterparts the GaN-device achieves by a factor of 3 lower static area specific on-state resistance R(ON)*A, and by a factor of 3 lower static on-state resistance times gate charge product R(ON)*Q. In switching tests the device achieves a low dynamic dispersion and low switching losses. Furthermore in this work a sophisticated measurement setup for characterization of dynamic parameters is developed and demonstrated. Characterization and test conditions are adapted for the use in fast-switching power converter applications.
Author(s)
Reiner, Richard  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Waltereit, Patrick  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Benkhelifa, Fouad  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Müller, Stefan
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Wespel, M.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Quay, Rüdiger  orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Schlechtweg, M.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Mikulla, Michael  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Ambacher, Oliver  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Mainwork
35th IEEE Compound Semiconductor Integrated Cicuit Symposium, CSIC 2013  
Conference
Compound Semiconductor Integrated Cicuit Symposium (CSIC) 2013  
DOI
10.1109/CSICS.2013.6659219
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • power conversion

  • AlGaN/GaN-on-Si

  • low dynamic on-state-resistance

  • low gate charge

  • low switching losses

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