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EUSPEN International Topical Conference on Precision Engineering, Micro Technology, Measurement Techniques and Equipment 2003. Proceedings. Vol.1
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2003
Conference Proceeding
Title
EUSPEN International Topical Conference on Precision Engineering, Micro Technology, Measurement Techniques and Equipment 2003. Proceedings. Vol.1
Title Supplement
May 19th - 20th, 2003, Aachen, Germany
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Person Involved
Weck, Manfred
Corporate Author
European Society for Precision Engineering and Nanotechnology -EUSPEN-
Fraunhofer-Institut für Produktionstechnologie -IPT-, Aachen
Physikalisch-Technische Bundesanstalt -PTB-, Braunschweig
Publisher
Riehm
Publishing Place
Voerde
Conference
International Topical Conference on Precision Engineering, Micro Technology, Measurement Techniques and Equipment 2003
Language
English
Fraunhofer-Institut für Produktionstechnologie IPT