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Optical properties determination at 10.6 mikro m of thin semiconducting layers.
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1983
Journal Article
Title
Optical properties determination at 10.6 mikro m of thin semiconducting layers.
Other Title
Bestimmung der optischen Eigenschaften von duennen Halbleiterschichten bei 10.6 mikro m
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Author(s)
Falco, C.
Botineau, J.
Azema, A.
Micheli, M. de
Ostrowsky, D.B.
Journal
Applied physics. A
Language
English
Fraunhofer-Institut für Physikalische Messtechnik IPM
Keyword(s)
Brechzahlprofil
Wellenleiter