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  4. Auger recombination in intrinsic GaAs
 
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1993
Journal Article
Title

Auger recombination in intrinsic GaAs

Other Title
Auger-Rekombination in intrinsischem GaAs
Abstract
The recombination kinetics of the electron-hole plasma in strongly excited, intrinsic GaAs is investigated at room temperature by time-resolved photoluminescence using a line-shape analysis of transient spectra. Special structuring of the samples prevents stimulated emission and diffusion. Population of higher energetic subsidiary conduction-band valleys must be taken into account for densities bigger than 1.5 x 10high19 cmhighminus3. A significant influence of Auger recombination is detected for densities bigger than 2.5 x 10high19 cmhighminus3. The bimolecular recombination coefficient and an effective Auger coefficient are found to be B is equal to (1.7 plusminus 0.2) x 10highminus10 cmhigh3 shighminus1 and Csubeff is equal to (7 plusminus 4) x 10highminus30 cmhigh6 shighminus1, respectively.
Author(s)
Strauss, U.
Rühle, W.W.
Köhler, Klaus  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Journal
Applied Physics Letters  
DOI
10.1063/1.108817
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • Auger recombination

  • Auger-recombination

  • III-V Halbleiter

  • III-V semiconductors

  • timeresolved photoluminescence

  • zeitaufgelöste Photolumineszenz

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