• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. Memory effect of Ge in III-V semiconductors
 
  • Details
  • Full
Options
2008
Conference Paper
Title

Memory effect of Ge in III-V semiconductors

Abstract
Epitaxial growth of germanium is attractive for Ge/III-V hetero devices Such as multi-junction solar cells. We investigated the growth of Ge with iso-butyl germane (IBGe) as germanium source and found a strong memory effect in our AlX2600-G3 metalorganic vapor phase epitaxy (MOVPE) reactor. The germanium background led to a higher n-type doping of i-GaAs and strongly reduced the photoluminescence (PL) intensity of Al0.3Ga0.7As and Ga0.5In0.5P. With secondary ion mass spectroscopy (SIMS) the quality of Ge in Al0.3Ga0.7As could be determined to be in the range of 2 X 10(17) cm(-3), whereas a Ge-atom concentration in Ga0.5In0.5P of up to 2 x 10(18) cm(-3) was measured. The memory effect Could be eliminated by changing all contaminated parts inside the MOVPE reactor.
Author(s)
Welser, E.
Guter, Wolfgang
Wekkeli, Alexander  
Dimroth, Frank  
Mainwork
The proceedings of the Fourteenth International Conference on Metalorganic Vapor Phase Epitaxy, ICMOVPE XIV  
Conference
International Conference on Metalorganic Vapor Phase Epitaxy (ICMOVPE) 2008  
DOI
10.1016/j.jcrysgro.2008.08.037
Language
English
Fraunhofer-Institut für Solare Energiesysteme ISE  
  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024