• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Artikel
  4. Precision assembly of a miniaturized wire deflector for electron-beam lithography
 
  • Details
  • Full
Options
2012
Journal Article
Title

Precision assembly of a miniaturized wire deflector for electron-beam lithography

Abstract
The fast and precise deflection of electron-beams is mandatory for common electron beam tools and next generation multi-beam lithography systems. Electrostatic fields generated by an arrangement of electrodes with several electric potentials are used to control the electron beam. The miniaturization of such a beam-deflection system facilitates its integration at a favorable place within the electron-optical column. An efficient and accurate beam deflection with high sensitivity and low aberrations is consequently possible. The novel wire-based electrostatic deflector for electron-beam Lithography Tools presented in this paper strictly pursues this approach. Design investigations as well as manufacturing and alignment procedures are reported. 24 wire electrodes are arranged in a circular FEA-optimized pattern and kinematically well-defined mounted to a supporting structure using the Solderjet Bumping technique . This flux free solder technique ensures vacuum compatible j oints free of hydrocarbons and with an excellent long-term stability. A prototype of the wire deflector is measured by means of a high resolution X-ray computer tomography scanner (CT) . The single wire elements of the wire deflector are symmetrically arranged to each other within an accuracy of a few microns.
Author(s)
Risse, Stefan  
Damm, Christoph  
Hornaff, Marcel
Kamm, Andreas  
Mohaupt, Matthias  
Eberhardt, Ramona  
Schmidt, Ingo  
Ramm, Roland  
Kühmstedt, Peter  
Notni, Gunther  
Döring, Hans-Joachim
Elster, Thomas
Kirschstein, Ulf Carsten
Schenk, Christoph
Journal
Microelectronic engineering  
Conference
International Conference on Micro- and Nano-Engineering (MNE) 2011  
DOI
10.1016/j.mee.2012.04.014
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Keyword(s)
  • electron beam lithography

  • wire deflector

  • electron-optical column

  • precision assembly

  • solderjet bumping multi shaped beam

  • computed tomography measurement

  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024