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  4. Fast thickness measurements with frequency modulated continuous wave terahertz radiation
 
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2016
Conference Paper
Title

Fast thickness measurements with frequency modulated continuous wave terahertz radiation

Abstract
Broadband laser based terahertz systems for multilayer thickness inspections are getting established in industrial environments, such as in the quality control for paint processes in the automotive industry. Within this contribution we address another highly attractive and complementary industrial terahertz application by the thickness and density inspection of thick and multilayer plastics as for example in the field of tube production. In order to inspect plastic layers from millimeter to several tens of centimeters thickness at measurement rates of up to several kilohertz, we use electronic frequency modulated continuous wave terahertz systems operating in the terahertz regime below 500 GHz.
Author(s)
Schreiner, Nina S.
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Baccouche, Bessem
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Sauer-Greff, Wolfgang
Urbansky, Ralph
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Friederich, Fabian  
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Mainwork
41st International Conference on Infrared, Millimeter, and Terahertz waves, IRMMW-THz 2016  
Conference
International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) 2016  
DOI
10.1109/IRMMW-THz.2016.7758594
Language
English
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Keyword(s)
  • Thickness Measurement

  • Frequency Modulation

  • Submillimetre Wave Measurement

  • Multilayer Plastics

  • Terahertz Radiation

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