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  4. Ptychographic coherent diffractive imaging using high photon flux Table-top XUV sources
 
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2018
Conference Paper
Title

Ptychographic coherent diffractive imaging using high photon flux Table-top XUV sources

Abstract
We present a table-top coherent imaging setup at 18 nm that achieves resolution close to one-wavelength in an extended field of view. A Siemens-star pattern is used as an ultimate resolution test on non-periodic samples.
Author(s)
Tadesse, G.K.
Eschen, W.
Klas, R.
Tschernajew, M.
Tuitje, F.
Spielmann, C.
Tünnermann, A.
Limpert, J.
Rothhardt, J.
Mainwork
Compact EUV & X-ray Light Sources  
Conference
Conference "Compact EUV & X-ray Light Sources" 2018  
Conference "High-Brightness Sources and Light-Driven Interactions" 2018  
DOI
10.1364/EUVXRAY.2018.ET2B.5
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
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