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  4. An age-wear-dependent model of failure and its description by cut-off Markov processes
 
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1982
Conference Paper
Title

An age-wear-dependent model of failure and its description by cut-off Markov processes

Abstract
An arbitrary functional dependence between the probability of failure on the one hand and the age and wear of a component on the other is assumed. The wear is assumed measurable and is described by cut-off Markov processes. Expressions are presented for the distribution of the failure time as well as for the failure rate. The application of the failure model is demonstrated by examples. The results of numerical computations are figured.
Author(s)
Giglmayr, J.
Mainwork
Reliability in electrical and electronic components and systems  
Conference
European Conference on Electrotechnics 1982  
Language
English
Fraunhofer-Institut für Nachrichtentechnik, Heinrich-Hertz-Institut HHI  
Keyword(s)
  • markov processes

  • reliability theory

  • age-wear-dependent model of failure

  • cut-off markov processes

  • probability of failure

  • failure time

  • failure rate

  • failure model

  • results of numerical computations

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