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  4. Technology for VLSI devices on ion implanted buried silicon nitride
 
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1985
Conference Paper
Title

Technology for VLSI devices on ion implanted buried silicon nitride

Title Supplement
Parallelausgabe: Publications 1985. IMS-Duisburg.
Abstract
A CMOS technology on implanted buried silicon nitride suitable for high density circuits is presented. Physical and electrical properties of the generated layers, their interfaces and fabricated devices are discussed. (IMS)
Author(s)
Vogt, H.
Zimmer, G.
Mainwork
2nd International Workshop on Future Electron Devices - SOI Technology and 3D Integration  
Conference
International Workshop on Future Electron Devices - SOI Technology and 3D Integration 1985  
Language
English
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
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