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  4. THz detection by field-effect transistors in magnetic fields: Shallow water vs. deep water mechanism of electron plasma instability
 
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2008
Journal Article
Title

THz detection by field-effect transistors in magnetic fields: Shallow water vs. deep water mechanism of electron plasma instability

Other Title
Terahertz Detektion mittels Feldeffekt-Transistoren in magnetischen Feldern: Seichtwasser- versus Tiefwasser-Mechanismen der Elektronplasma-Instabilität
Abstract
Detection of THz radiation by a high electron mobility (HEMT) GaAs/GaAlAs transistor was investigated at 4 K as a function of the magnetic field B. The detection signal (a source - drain photovoltage appearing as a response to THz radiation) was found to be periodic in B(exp -1), i.e., it showed Shubnikow - de Haas oscillations. A Fourier transform of the signal showed a large amplitude component independent of the gate polarization, and a small amplitude component dependent on it. This shows that a HEMT response to the radiation cannot be described either by a plasma instability in gated ("shallow water") or in ungated ("deep water") parts of the channel, but rather by a response of the channel as a whole. This is in a good correspondence with recent experimental evidence of antenna effects in detection of radiation by HEMTs and advanced theoretical models of instability of coupled gated - ungated plasma in HEMTs.
Author(s)
Sakowicz, M.
Lusakowski, J.
Karpierz, K.
Grynberg, M.
Knap, W.
Köhler, Klaus  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Valusis, G.
Golaszewska, K.
Kaminska, E.
Piotrowska, A.
Journal
International journal of high speed electronics and systems  
DOI
10.1142/S0129156408005904
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • III-V semiconductor

  • III-V Halbleiter

  • heterostructure

  • Heterostruktur

  • electrical property

  • elektrische Eigenschaft

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