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  4. A Closer Look to Fan-out Panel Level Packaging
 
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2023
Conference Paper
Title

A Closer Look to Fan-out Panel Level Packaging

Abstract
Fan-out Wafer and Panel Level Packaging are two of the dominating trends in microelectronics packaging. Both approaches with different flavors as RDL last face-up or face-down have reached maturity and are introduced in high volume manufacturing. This paper discusses warpage in detail as one key challenge in fan-out packaging and how to influence the warpage during processing of a reconfigured panel for Chip first / RDL last approach.
Author(s)
Braun, Tanja  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Hölck, Ole
Voitel, Marcus
Obst, Mattis
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Voges, Steve  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Becker, Karl-Friedrich  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Aschenbrenner, Rolf  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Schneider-Ramelow, Martin
Mainwork
IEEE EDTM 2023, 7th Electron Devices Technology and Manufacturing Conference  
Project(s)
16FMD01K  
Funder
Bundesministerium für Bildung und Forschung  
Conference
Electron Devices Technology and Manufacturing Conference 2023  
DOI
10.1109/EDTM55494.2023.10102969
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Keyword(s)
  • Fan-out Panel Level Packaging

  • Warpage and Compression Molding

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