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  4. Lifetime modeling based on anodic oxidation failure for packages with internal galvanic isolation
 
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2017
Conference Paper
Title

Lifetime modeling based on anodic oxidation failure for packages with internal galvanic isolation

Abstract
In More-than-Moore technologies, the number and complexity of micro and nano devices, that are directly integrated into control units of power electronics and mechatronics systems, increase. These systems typically operate at working voltages in the range of 220-1000 VRMS.
Author(s)
Schaller, R.
Strutz, V.
Theuss, H.
Dudek, Rainer  
Rzepka, Sven  
Mainwork
18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2017  
Conference
International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems 2017  
DOI
10.1109/EuroSimE.2017.7926272
Language
English
Fraunhofer-Institut für Elektronische Nanosysteme ENAS  
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