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  4. UV-VIS-NIR scatter measurement methods for ultra precision surfaces and coatings
 
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2007
Conference Paper
Title

UV-VIS-NIR scatter measurement methods for ultra precision surfaces and coatings

Abstract
The capabilities of our optimized angle resolved and total light scattering measurement systems in the ultraviolet to near-infrared spectral ranges are described and examples of investigations on multilayer gratings and diamond turned optics given. ©2007 Optical Society of America
Author(s)
Gliech, S.
Wendt, R.
Duparre, A.
Mainwork
Optical Interference Coatings 2007. CD-ROM  
Conference
Optical Interference Coatings Topical Meeting and Tabletop Exhibit (OIC) 2007  
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Keyword(s)
  • instrumentation

  • measurement

  • metrology

  • scattering measurement

  • thin films

  • optical properties

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