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  4. In-situ sintering studies on nano-alumina
 
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2003
Conference Paper
Title

In-situ sintering studies on nano-alumina

Abstract
The optimization of the sintering process becomes nowadays a very important step towards obtaining improved quality ceramics for applications into many industrial areas. Recently, a thermooptical measuring device (TOM) has been developed to in-situ monitor the thermal diffusivity, shrinkage and light scattering of materials during sintering. In present work the TOM method has been used to identify the temperature boundary between different stages of sintering of nano-alumina and to measure the diameter of the sintering necks formed during the incipient stages of the consolidation process. The initial nanopowders have been characterized for particle size by the TEM method. The nano-crystalline powders were sintered into the TOM device in a temperature range between room temperature and 1300°C, with a heating rate of 12°C/min. Interrupted sintering experiments were performed by TOM and Microwave Sintering followed by microstructural observations.
Author(s)
Stanciu, L.A.
Raether, F.
Groza, J.R.
Mainwork
Nanotech 2003, Nanotechnology Conference and Trade Show. Vol.3  
Conference
Nanotechnology Conference and Trade Show (Nanotech) 2003  
International Conference on Modeling and Simulation of Microsystems (MSM) 2003  
International Conference on Computational Nanoscience and Technology (ICCN) 2003  
Workshop on Compact Modeling (WCM) 2003  
Language
English
Fraunhofer-Institut für Silicatforschung ISC  
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