• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Artikel
  4. Photoluminescence topography, PICTS and microwave conductivity investigation of EL6 in GaAs
 
  • Details
  • Full
Options
2002
Journal Article
Title

Photoluminescence topography, PICTS and microwave conductivity investigation of EL6 in GaAs

Other Title
Photolumineszenztopographie, PICTS- und Mikrowellenleitfähigkeitsuntersuchungen von EL6 in GaAs
Abstract
Further evidence was found that the 0.8 eV luminescence band in GaAs is correlated to the EL6 defect as identified by photo induced current transient spectroscopy (PICTS). From luminescence topography arguments are put forward that the EL6 defect should not be the dominant recombination centre in GaAs. By the application of microwave detected PICTS it could be shown that the EL6 is definitely not a relevant recombination centre. Recombination takes place most probably via different, partially not jet identified centres.
Author(s)
Steinegger, T.
Gründig-Wendrock, B.
Baeumler, Martina  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Jurisch, M.
Jantz, W.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Niklas, J.
Journal
Materials Science and Engineering, B. Solid state materials for advanced technology  
DOI
10.1016/S0921-5107(01)00959-X
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • photoluminescence topography

  • Photolumineszenztopographie

  • microwave absoption

  • Mikrowellenabsorption

  • PICTS

  • Si-GaAs

  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024