On the use of SiGe MMIC based VNA Extension Modules in the scope of Material Characterization

This paper presents the evaluation of Silicon-Germanium (SiGe) MMIC based frequency extension modules for vector network analyzers in the scope of material characterization. The performance of the MMIC based extension modules is compared to a state-of-the-art commercial extension module in the D-band (110 GHz to 170 GHz). The measurements are conducted using a corrugated horn based material characterization kit (MCK) from SwissTo12. The dynamic range of the measurement setup is assessed after calibration. The results of the material measurements are compared and discussed. The relative permittivity and loss tangent of a silicon wafer, a Polypropylen plate and a ceramic absorber tile are determined and compared. The results of the materials under test are found to be in good agreement. The presented MMIC based frequency extension modules provide a cost effective and compact alternative to conventional extension modules for material characterization measurements.