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  4. A digital 25 m pixel-pitch uncooled amorphous silicon TEC-less VGA IRFPA with massive parallel Sigma-Delta-ADC readout
 
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2010
Conference Paper
Title

A digital 25 m pixel-pitch uncooled amorphous silicon TEC-less VGA IRFPA with massive parallel Sigma-Delta-ADC readout

Abstract
This paper presents an advanced 640 x 480 (VGA) IRFPA based on uncooled microbolometers with a pixel-pitch of 25µm developed by Fraunhofer-IMS. The IRFPA is designed for thermal imaging applications in the LWIR (8 .. 14µm) range with a full-frame frequency of 30 Hz and a high sensitivity with NETD < 100 mK @ f/1. A novel readout architecture which utilizes massively parallel on-chip Sigma-Delta-ADCs located under the microbolometer array results in a high performance digital readout. Sigma-Delta-ADCs are inherently linear. A high resolution of 16 bit for a secondorder Sigma-Delta-modulator followed by a third-order digital sinc-filter can be obtained. In addition to several thousand Sigma-Delta-ADCs the readout circuit consists of a configurable sequencer for controlling the readout clocking signals and a temperature sensor for measuring the temperature of the IRFPA. Since packaging is a significant part of IRFPA's price Fraunhofer-IMS uses a chip-scaled package consisting of an IR-transparent window with antireflection coating and a soldering frame for maintaining the vacuum. The IRFPAs are completely fabricated at Fraunhofer-IMS on 8" CMOS wafers with an additional surface micromachining process. In this paper the architecture of the readout electronics, the packaging, and the electro-optical performance characterization are presented.
Author(s)
Weiler, D.
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Ruß, M.
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Würfel, D.
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Lerch, R.G.
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Yang, P.
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Bauer, J.
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Vogt, H.
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Mainwork
Infrared technology and applications XXXVI  
Conference
Conference "Infrared Technology and Applications" 2010  
DOI
10.1117/12.849839
Language
English
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Keyword(s)
  • infrared detector

  • IRFPA

  • VGA

  • uncooled microbolometer

  • amorphous silicon

  • Sigma-Delta-ADC on chip

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