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  4. High temporal stability of niobium superconducting resonators by surface passivation with organophosphonate self-assembled monolayers
 
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2026
Journal Article
Title

High temporal stability of niobium superconducting resonators by surface passivation with organophosphonate self-assembled monolayers

Abstract
One main limiting factor towards achieving high coherence times in superconducting circuits is two-level system (TLS) losses. Mitigating such losses requires controlling the formation of native oxides at the metal-air interface. Here, we report the growth of alkyl-phosphonate self-assembled monolayers (SAMs) on Nb thin films following oxide removal. The impact of passivation was evaluated via the performance of coplanar waveguide resonators at 10 mK, in terms of quality factor and resonant frequency, over six days of air exposure. Un-passivated resonators exhibited an ~80% increase in loss at single-photon power levels, whereas SAM-passivated resonators maintained excellent temporal stability, attributed to suppressed oxide regrowth. By employing a two-component TLS model, we discern distinct prominent loss channels for each resonator type and quantified the characteristic TLS loss of the SAMs to be ~5×10-7. We anticipate our passivation methodology to offer a promising route toward industrial-scale qubit fabrication, particularly where long-term device stability is critical.
Author(s)
Gupta, Harsh K.
Technische Universität München
Pereira, Rui
Fraunhofer-Institut für Elektronische Mikrosysteme und Festkörper-Technologien EMFT  
Koch, L.
Walther-Meißner-Institut
Bruckmoser, Niklas
Walther-Meißner-Institut
Singer, Moritz
Technische Universität München
Schoof, Benedikt
Technische Universität München
Kompatscher, Manuel
Technische Universität München
Filipp, Stefan
Walther-Meißner-Institut
Tornow, Marc  
Fraunhofer-Institut für Elektronische Mikrosysteme und Festkörper-Technologien EMFT  
Journal
Communications materials  
Funder
Bundesministerium für Forschung, Technologie und Raumfahrt  
Open Access
File(s)
Download (2.36 MB)
Rights
CC BY 4.0: Creative Commons Attribution
DOI
10.1038/s43246-025-01068-8
10.24406/publica-9735
Additional link
Full text
Language
English
Fraunhofer-Institut für Elektronische Mikrosysteme und Festkörper-Technologien EMFT  
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