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  4. Characterization of bump arrays at RF/microwave frequencies
 
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2005
Journal Article
Title

Characterization of bump arrays at RF/microwave frequencies

Abstract
A systematic procedure for the characterization of complex bump configurations at RF and microwave frequencies, is presented. Beginning with simple arrangements - single- and two-coupled bumps - full-wave electromagnetic (EM) field analysis, circuit simulations and RF measurements were used for the development and validation of their respective equivalent circuit models. These models were then extended to characterize three-coupled bumps, both in linear and triangular configurations. Finally, a combination of all the electrical parameters obtained from these simple bump configurations was used to characterize a complete bump array, taking into consideration that for pitches used in most high-speed packages, EM coupling between a bump and its "next but one" neighbor can be neglected.
Author(s)
Ndip, Ivan  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Sommer, G.
John, Werner
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Reichl, Herbert
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Journal
Microelectronics reliability  
DOI
10.1016/j.microrel.2004.08.001
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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