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  4. Laser conditioning of LaF3/MgF2 dielectric coatings at 248 nm
 
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1996
Journal Article
Title

Laser conditioning of LaF3/MgF2 dielectric coatings at 248 nm

Abstract
Highly reflective LaF3/MgF2 systems for a wavelength of 248 nm on MgF2 and crystalline quartz substrates were investigated. The influence of laser conditioning on damage threshold and absorptance was remarkable in those coatings that had a high initial absorptance. Monitoring with a laser calorimeter revealed the conditioning effect to be a function of the irradiation dose rather than of energy density or pulse rate. Furthermore, x-ray photoelectron spectroscopy and transmission electron microscopy investigations showed that conditioning induces stoichiometric and structural changes in the multilayers, especially in near-surface sublayers, whereas scanning electron microscopy and atomic force microscopy investigated that the surface remains unchanged.
Author(s)
Kaiser, N.
Eva, E.
Mann, K.
Henking, R.
Ristau, D.
Anton, B.
Weißbrodt, P.
Mademann, D.
Raupach, L.
Hacker, E.
Journal
Applied optics  
DOI
10.1364/AO.35.005918
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Keyword(s)
  • Dünne optische Schicht

  • excimer laser optics

  • fluoride thin films

  • Fluoridschicht

  • laser induced damage threshold

  • Laserzerstörschwelle

  • optical coating

  • optical thin films

  • oxide thin films

  • Oxidschicht

  • ultraviolet spectral region

  • ultravioletter Spektralbereich

  • UV

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