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  4. Silver bonding wire - an alternative for mechanical sensitive chip configurations in automotive electronics packaging
 
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2023
Journal Article
Title

Silver bonding wire - an alternative for mechanical sensitive chip configurations in automotive electronics packaging

Abstract
Silver (Ag) bond wires are mainly used in consumer products as a reliable low-cost alternative to gold (Au) bond wires. In previous investigations, we have shown that silver wires also have potential for use in the automotive sector (1, 2, 3, 4], where the materials are exposed to particularly harsh environmental conditions. In order to understand thc intluence of these conditions in the electronic package on the silveraluminum material system, we carried out extensive studies on test packages built on laboratory level. For the future development of challenging automotive devices, it will be important to have a cooperation between semiconductor package developer and material supplier with an assist of characterization spccialists. In this project, we formed a threeparty project in which characterization specialists, package developer, and wire manufacturer collectivcly conduct a feasibility study of a new Ag wire material for automotive application. Two wire types (standard Ag wire and new type of Ag wire GX2s) were chosen for the investigation in direct comparison regarding long-term reliability. Samples were built under mass production conditions and then subjected to various reliability tests following AEC-Q006 requirements. Subsequently, mechanical characterizations by means of ball shear and pull tests as weil as high resolution SEM microstructure analyses on cross-section samples are applied. In the paper, results of the different tests will be summarized, but a more in-depth analysis will be given to the temperature cycle test (TCT), where the most significant differences between the sample variations occurred. Overall, the results show the importance of the knowledge for the material reliability upfront a device qualification process (robustness validation) and give further guidance for material selection.
Author(s)
Klengel, Robert
Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS  
Klengel, Sandy  
Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS  
Tismer, Sebastian
Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS  
Araki, Noritoshi
Eto, Motoki
Haibara, Teruo
Yamada, Takashi
Feldmann, Jochen
Scheer, Achim
Binner, Ralph
Peters, Henk
Journal
IMAPSource Proceedings  
Conference
European Microelectronics and Packaging Conference 2023  
Open Access
DOI
10.4071/001c.94749
Additional link
Full text
Language
English
Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS  
Keyword(s)
  • automotive electronics packaging

  • long term reliability

  • silver wire bonding

  • TCT

  • temperature cycle test

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