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  4. Analytical, scaleable large signal noise model for GaAs and InP MMIC applications
 
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1999
Conference Paper
Title

Analytical, scaleable large signal noise model for GaAs and InP MMIC applications

Other Title
Analytisches und skalierbares Gross-Signal- und Hochfrequenz-Rauschmodell für Mikrowellenschaltungen basierend auf den Materialsystem GaAs und InP
Abstract
In this paper an analytical large signal noise model for GaAs- and InP-based HFETs is presented. The capability of the model is verified by the comparison of measured and simulated bias dependence of the high frequency noise behaviour of various III/V-devices. Furthermore, the model extraction procedure and the implementation into a commercial microwave design system is shown. The use for MMIC applications is demonstrated by the comparison of measured and simulated noise properties of a single stage optoelectronic receiver for 10 GHz.
Author(s)
Reuter, R.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Leven, A.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Mainwork
29th European Microwave Conference 1999. Conference proceedings. Vol.2  
Conference
European Microwave Conference (EuMC) 1999  
European Microwave Week (MIOP) 1999  
DOI
10.1109/EUMA.1999.338448
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • GaAs

  • HEMT

  • high-frequency

  • Hochfrequenz

  • InP

  • modeling

  • Modellierung

  • noise

  • Rauschen

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