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  4. How Small Can You Go? Compact Language Models for On-Device Critical Error Detection in Machine Translation
 
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2025
Conference Paper
Title

How Small Can You Go? Compact Language Models for On-Device Critical Error Detection in Machine Translation

Abstract
Large Language Models (LLMs) excel at evaluating machine translation (MT), but their scale and cost hinder deployment on edge devices and in privacy-sensitive workflows. We ask: how small can you get while still detecting meaning-altering translation errors? Focusing on English → German Critical Error Detection (CED), we benchmark sub-2 B models (LFM2-350M, Qwen-3 0.6B/1.7B, Llama-3.2-1B-Instruct, Gemma-3-1B) across WMT21, WMT22, and SynCED-EnDe 2025. Our framework standardizes prompts, applies lightweight logit-bias calibration and majority voting, and reports both semantic quality (MCC, F1-ERR/F1-NOT) and compute metrics (VRAM, latency, throughput). Results reveal a clear sweet spot around one billion parameters: Gemma-3-1B provides the best quality-efficiency trade-off, reaching MCC=0.77 with F 1 -ERR =0.98 on SynCEDEnDe 2025 after merged-weights fine-tuning, while maintaining 400 ms single-sample latency on a MacBook Pro M4 Pro (24 GB). At larger scale, Qwen-3-1.7B attains the highest absolute MCC (+0.11 over Gemma) but with higher compute cost. In contrast, ultra-small models (<0.6 B) remain usable with few-shot calibration yet under-detect entity and number errors. Overall, compact, instruction-tuned LLMs-augmented with lightweight calibration and small-sample supervision, can deliver trustworthy, on-device CED for MT, enabling private, low-cost error screening in realworld translation pipelines. All datasets, prompts, and scripts are publicly available at our GitHub repository.11The code and instructions are available at: https://github.com/AppliedMachineLearning-Lab/How-small-can-you-get
Author(s)
Chopra, Muskaan
Universität Bonn
Sparrenberg, Lorenz
Universität Bonn
Khanna, Sarthak
Universität Bonn
Sifa, Rafet  
Fraunhofer-Institut für Intelligente Analyse- und Informationssysteme IAIS  
Mainwork
IEEE International Conference on Big Data, BigData 2025  
Conference
International Conference on Big Data 2025  
DOI
10.1109/BigData66926.2025.11401605
Language
English
Fraunhofer-Institut für Intelligente Analyse- und Informationssysteme IAIS  
Keyword(s)
  • Critical Error Detection (CED)

  • Edge AI

  • Large Language Models (LLMs)

  • Machine Translation (MT)

  • On-Device Inference

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