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  4. A split- and delay-unit for the European XFEL
 
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2013
Conference Paper
Title

A split- and delay-unit for the European XFEL

Abstract
For the European XFEL an x-ray split- and delay-unit (SDU) is built covering photon energies from 5 keV up to 20 keV. This SDU will enable time-resolved x-ray pump/x-ray probe experiments as well as sequential diffractive imaging on a femtosecond to picosecond time scale. Further, direct measurements of the temporal coherence properties will be possible by making use of a linear autocorrelation. The set-up is based on geometric wavefront beam splitting, which has successfully been implemented at an autocorrelator at FLASH. The x-ray FEL pulses will be split by a sharp edge of a silicon mirror coated with Mo/B4C multi layers. Both partial beams will then pass variable delay lines. For different wavelengths the angle of incidence onto the multilayer mirrors will be adjusted i n order to match the Bragg condition. For a photon energy of h ny = 20 keV a grazing angle of theta = 0.57° has to be set, which results in a footprint of the beam (6 sigma) on the mirror of l = 120 mm. At this photon energy the reflectance of a Mo/B4C multilayer coating with a multilayer period of d = 3.2 nm and N = 200 layers amounts to R = 0.92. In order to enhance the maximum transmission for photon energies of h ny = 8 keV and below, a Ni/B4C multilayer coating can be applied beside the Mo/B4C coating for this spectral region. Because of the different incidence angles, the path lengths of the beams will differ as a function of wavelength. Hence, maximum delays between +/- 2.5 ps at h ny= 20 keV and up to +/- 23 ps at h ny = 5 keV will be possible.
Author(s)
Roling, S.
Braun, S.
Gawlitza, P.
Samoylova, L.
Siemer, B.
Sinn, H.
Siewert, F.
Wahlert, F.
Wöstmann, M.
Zacharias, H.
Mainwork
Advances in x-ray free-electron lasers: Instrumentation  
Conference
Conference "Advances in X-Ray Free-Electron Lasers - Instrumentation" 2013  
DOI
10.1117/12.2027029
Additional link
Full text
Language
English
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Keyword(s)
  • angle of incidence

  • diffractive imaging

  • direct measurement

  • multi-layer mirrors

  • multi-layer-coating

  • picosecond time scale

  • temporal coherence

  • variable delay lines

  • coating

  • mirrors

  • multilayer

  • photon

  • x-ray

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