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  4. The effects of increasing filler loading on the contact resistivity of interconnects based on silver-epoxied conductive adhesives and silver metallization pastes
 
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2025
Journal Article
Title

The effects of increasing filler loading on the contact resistivity of interconnects based on silver-epoxied conductive adhesives and silver metallization pastes

Abstract
Our previous work highlighted how microscopic structural effects influence the sheet and contact resistance of electrically conductive adhesives (ECAs). Herein, we delve further by investigating how the contact and bulk resistivity of several ECAs that are based on the same formulation, but with different filler content, are correlated with the filler content. Additionally, two different filler geometries - high and low surface area (HSA and LSA) fillers - are combined in different ratios to maintain a similar viscosity and therefore processability. Hence, contact and bulk resistivities are also correlated with the different geometry ratios of these two fillers. As expected, it was found that the contact and bulk resistivities decreased when the filler content was increased. However, the magnitude of the decrease was found to depend strongly on the filler geometry ratio. At extreme filler geometry ratios, when the bulk is either mostly loaded with HSA-fillers or mostly with LSA-fillers, the impact of changes in the filler content on the bulk and contact resistivities is markedly different. The measured data is interpreted within the context of percolation theory and it is determined that the optimum ratio of the LSA and HSA Ag-fillers investigated in this study is approximately 60:40 (for an epoxy-based adhesive). This work has important ramifications for the design of ECAs, where cost considerations and the need to reduce silver resource usage demand the lowest (silver) filler content, but the demands of product performance point to higher filler content.
Author(s)
Devoto Acevedo, Maria Ignacia
Wells, Rich
Großer, Stephan  
Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS  
Wienands, Karl
Rudolph, Dominik
Halm, Andreas
Gottschalg, Ralph
Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS  
Tune, Daniel
Journal
Progress in Photovoltaics  
Conference
European Photovoltaic Solar Energy Conference and Exhibition 2023  
Open Access
DOI
10.1002/pip.3787
Language
English
Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS  
Keyword(s)
  • bulk resistivity

  • contact resistivity

  • ECA

  • ECA-based interconnects

  • filler content

  • high surface area fillers

  • low surface area fillers

  • TLM

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