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  4. Wafer level vacuum packaging of scanning micro-mirrors using glass-frit and anodic bonding methods
 
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2013
Conference Paper
Title

Wafer level vacuum packaging of scanning micro-mirrors using glass-frit and anodic bonding methods

Abstract
In this paper the authors report about the six inch wafer level vacuum packaging of electro-statically driven two dimensional micro-mirrors. The packaging was done by means of two types of wafer bonding methods: anodic and glass frit. The resulting chips after dicing are 4 mm wide, 6 mm long and 1.6 mm high and the residual pressure inside the package after dicing was estimated to be between 2 and 20 mbar. This allowed us to reduce the driving voltage of the micro-mirrors by more than 40% compared to the driving voltage without vacuum packaging. The vacuum stability after 5 months was verified by measurement using the so called "membrane method". Persistence of the vacuum was proven. No getter materials were used for packaging.
Author(s)
Langa, Sergiu  
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Drabe, Christian  
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Kunath, Christian
Franhofer IPMS
Dreyhaupt, André  
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Schenk, Harald  
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Mainwork
Reliability, packaging, testing, and characterization of MOEMS/MEMS and nanodevices XII  
Conference
Conference "Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices" 2013  
DOI
10.1117/12.2003525
Language
English
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Keyword(s)
  • green photonics

  • wafer level vacuum packaging

  • micro-mirrors

  • wafer bonding

  • energy efficiency

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