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2005
Conference Paper
Title

Integrated CMOS active pixel sensor with low capacitance large area photodiodes

Abstract
A novel CMOS X-ray active pixel sensor for indirect C.T. X-ray detection has been developed. A Cadmium tungstate (CdWO4) scintillator array glued on top is used is for the X-ray to light conversion. The array uses separation by white colored lead stripes to prevent pixel crosstalk and to shield the underlying CMOS electronics from direct radiation. Noise reduction by reducing the detector junction capacitance is applied to increase the SNR, instead of increasing the sensitivity. For this purpose a new low capacitance, low dark current dot type photodiode based on minority diffusion has been developed. The dynamic range is expanded to 17 bit by the use of individual in-pixel automatic gain control. A photon noise limited detector exhibiting a 20 x 10 pixel array and integrated temperature sensor has been realized in a standard 1.2µm CMOS process, which can be read out with a frame rate of 3000 frames/sec.
Author(s)
Kemna, A.
Brockherde, W.
Hosticka, B.J.
Özkan, E.
Steadman, R.
Vogtmeier, G.
Mainwork
SDS 2005. Abstract Book  
Conference
European Symposium on Semiconductor Detectors (SDS) 2005  
Language
English
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Keyword(s)
  • active pixel sensor

  • pixel array

  • x-ray detection

  • Pixelmuster

  • CMOS-Sensor

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