• English
  • Deutsch
  • Log In
    Password Login
    or
  • Research Outputs
  • Projects
  • Researchers
  • Institutes
  • Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. Wafer level approaches for the integration of carbon nanotubes in electronic and sensor applications
 
  • Details
  • Full
Options
2012
Conference Paper
Titel

Wafer level approaches for the integration of carbon nanotubes in electronic and sensor applications

Abstract
In this work we give an overview about recent developments in the integration technology of CNTs. We focus on wafer level approaches with the CVD and DEP method for growing as well as depositing CNTs in a defined way. So that we present methods to manipulate CNT growth structure, growth mode as well as growth inhibition in thermal CVD processes. This is highlighted by a unique growth structure opening new possibilities for CNT integration. Likewise, we show recent developments in scaling up the DEP method on wafer level. We round it up with the fabrication of CNT vias and MEMS structures containing CNT sensor elements.
Author(s)
Hermann, S.
Fiedler, H.
Haibo, Y.
Loschek, S.
Bonitz, J.
Schulz, S.E.
Gessner, T.
Hauptwerk
9th International Multi-Conference on Systems, Signals and Devices, SSD 2012
Konferenz
International Multi-Conference on Systems, Signals and Devices (SSD) 2012
Thumbnail Image
DOI
10.1109/SSD.2012.6198090
Language
English
google-scholar
Fraunhofer-Institut für Elektronische Nanosysteme ENAS
  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Send Feedback
© 2022