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2020
Book Article
Title

Hermeticity tests

Abstract
Microelectromechanical systems often contain sensitive structures whose operating response strongly depends on ambient conditions. The demand for a hermetic package is therefore vital. A variety of test methods for hermeticity testing have been developed in the past years. In this chapter a review on these leak tests is given. Starting from basic aspects of the kinetic gas theory and vacuum physics the principles of leak rate measurement are explained. An overview on existing leak rate measurement methods and their sensitivity is given. Exemplarily, the Neon ultra-fine leak test is explained in detail. Finally, the influence of a getter on the device life time is discussed.
Author(s)
Kähler, Dirk  
Fraunhofer Institute for Silicon Technology ISIT  
Lofink, Fabian  
Fraunhofer Institute for Silicon Technology ISIT  
Reinert, Wolfgang  
Fraunhofer Institute for Silicon Technology ISIT  
Journal
Handbook of Silicon Based MEMS Materials and Technologies
DOI
10.1016/B978-0-12-817786-0.00042-6
Language
English
Fraunhofer-Institut für Siliziumtechnologie ISIT  
Keyword(s)
  • Damping

  • Hermetic package

  • Hermeticity testing

  • Kinetic gas theory

  • Leak rate

  • Leak test

  • MEMS

  • Neon ultra-fine leak test

  • Q-factor monitoring

  • Vacuum degradation

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