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Multi-scale materials data for 3D TSV stack performance simulation and model validation
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2013
Conference Paper
Title
Multi-scale materials data for 3D TSV stack performance simulation and model validation
Author(s)
Zschech, E.
Yeap, K.B.
Sander, C.
Muehle, U.
Gall, M.
Sukharev, V.
Mainwork
9th International Conference and Exhibition on Device Packaging, DPC 2013
Conference
International Conference and Exhibition on Device Packaging 2013
Language
English
IZFP-D