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  4. Multi-scale materials data for 3D TSV stack performance simulation and model validation
 
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2013
Conference Paper
Title

Multi-scale materials data for 3D TSV stack performance simulation and model validation

Author(s)
Zschech, E.
Yeap, K.B.
Sander, C.
Muehle, U.
Gall, M.
Sukharev, V.
Mainwork
9th International Conference and Exhibition on Device Packaging, DPC 2013  
Conference
International Conference and Exhibition on Device Packaging 2013  
Language
English
IZFP-D  
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