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High-resolution material and surface topography characterization by a modified low-coherence interferometer
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2015
Poster
Title
High-resolution material and surface topography characterization by a modified low-coherence interferometer
Author(s)
Taudt, Christopher
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Baselt, Tobias
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Nelsen, Bryan
WH Zwickau
Koch, Edmund
TU Dresden
Hartmann, Peter
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
Project(s)
ENIAC
Funder
Bundesministerium für Bildung und Forschung BMBF (Deutschland)
Conference
International Summer School "New Frontiers in Optical Technologies" 2015
File(s)
Download (10.45 MB)
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Rights
Use according to copyright law
DOI
10.24406/publica-fhg-390353
Language
English
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
