English
Deutsch
Log In
Log in with Fraunhofer Smartcard
Password Login
Research Outputs
Fundings & Projects
Researchers
Institutes
Statistics
Fraunhofer-Gesellschaft
Home
Fraunhofer-Gesellschaft
Konferenzschrift
Reliability Testing of Polytronics Components in the Micro-Nano Region
Details
Full
Export
Statistics
Options
Show all metadata (technical view)
2005
Conference Paper
Title
Reliability Testing of Polytronics Components in the Micro-Nano Region
Author(s)
Michel, B.
Dudek, R.
Walter, H.
Mainwork
Polytronic 2005, 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics. Proceedings
Conference
International Conference on Polymers and Adhesives in Microelectronics and Photonics (Polytronic) 2005
DOI
10.1109/POLYTR.2005.1596479
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
