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  4. Humidity effects on the fatigue of fiber reinforced polymers in micro/nano functional systems
 
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2012
Conference Paper
Title

Humidity effects on the fatigue of fiber reinforced polymers in micro/nano functional systems

Abstract
Micro and nano functional systems like MEMS and smart systems are exposed to complex and very challenging service conditions (e.g., within airframe structures or in automotive applications under the hood or within battery cells). Therefore, long-term reliability and structural integrity of the chassis and the printed wiring boards is of rising concern. These parts are often made of fiber reinforced polymers (FRP). Recently, a new methodology for accelerated fatigue testing of FRP has been presented. It allows predictions of the structural fatigue lifetime of FRP for arbitrary temperatures and loading ratios based on three simple tests: visco-elastic DMA, constant strain rate tests, and high cycle fatigue tests at a limited number of temperatures and strain rates. However, this methodology considers dry samples only, which does not suffice for describing the behavior of micro/nano systems as mentioned before. The paper reports the approach to the expansion of this testing methodology to the effects of humidity. Choosing PCB material as typical example for FRP in micro/nano systems, the time / temperature shift functions have been determined for wet and dry samples. Subsequently, constant strain rate and high cycle fatigue tests have been performed. They show a substantial loss in strength and fatigue lifetime for FRP structures that were exposed humid environment. Determining the quantities measuring this reduction in structural reliability paves the way to the expansion of the fatigue testing methodology towards accounting for the humidity effect as well.
Author(s)
Pantou, Remi
Shah, D.L.
Michel, Bernd  
Rzepka, Sven  
Mainwork
International Semiconductor Conference Dresden-Grenoble, ISCDG 2012  
Conference
International Semiconductor Conference Dresden-Grenoble (ISCDG) 2012  
DOI
10.1109/ISCDG.2012.6360020
Language
English
Fraunhofer-Institut für Elektronische Nanosysteme ENAS  
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