In-line measurements and analyse for the crystalline silicon solar cell shunts

The efficiency of the solar cell can be degraded drastically by the shunts, some of which were originated from silicon material, but the most important shunts were induced by process. The simple measurement which can image the shunts directly was described by using the temperature sensitive liquid crystal sheet. Through analyzing all the major process-induced shunts in details, such as edge shunts, Schottky shunts, contamination-originated shunts, and so on, the reasons which influencing the efficiency of the solar cell can be deduced exactly.