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  4. Modelling of metal degradation in power devices under active cycling conditions
 
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2011
Conference Paper
Title

Modelling of metal degradation in power devices under active cycling conditions

Abstract
Metal degradation has recently received increased attention as a failure mechanism in power devices under active cycling conditions, i.e. under repeated pulsed voltage/current loads [1, 2]. Both electro-thermal and thermo-mechanical simulation are indispensable for understanding this mechanisms. The paper presents experimental and simulation data for a dedicated test structure. A suitable lifetime model has to go beyond a simple Coffin-Manson type model to capture the essential influencing parameters.
Author(s)
Kanert, W.
Pufall, R.
Wittler, O.
Dudek, R.
Bouazza, M.
Mainwork
12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011  
Conference
International Conference on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) 2011  
DOI
10.1109/ESIME.2011.5765771
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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