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In-situ FTIR emission spectroscopy in a technological environment: chemical vapour infiltration (CVI) of SiC composites
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1995
Journal Article
Title
In-situ FTIR emission spectroscopy in a technological environment: chemical vapour infiltration (CVI) of SiC composites
Author(s)
Hopfe, V.
Mosebach, H.
Erhard, M.
Meyer, M.
Journal
Journal of Molecular Structure
DOI
10.1016/0022-2860(95)08555-A
Language
English
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS
