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  4. Extreme optical nonlinearities unveiled by ultrafast laser filamentation in semiconductors
 
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2026
Journal Article
Title

Extreme optical nonlinearities unveiled by ultrafast laser filamentation in semiconductors

Abstract
Sky-high optical nonlinearities make semiconductors ideal platforms for multifunctional photonic devices. The fabrication of such complex devices could greatly benefit from in-volume ultrafast laser writing for monolithic and contactless integration. Ironically, as exemplified for Si, nonlinearities act as an efficient immune system that self-protects the material from internal permanent modifications. Predicting high-intensity ultrashort-pulse propagation beyond Si is further limited by incomplete descriptions of carrier dynamics in narrow-gap materials. Here, we demonstrate that filamentation universally dictates ultrashort laser pulse propagation in various semiconductors. The effective key nonlinear parameters extracted differ markedly from past measurements with low-intensity pulses, while temporal scaling laws for these parameters are also derived. Based on these findings, appropriate temporal-spectral shaping is proposed for tailored energy deposition inside semiconductors. The effective parameters also provide predictive inputs for semiconductor backside processing, microelectronics security, and high-harmonic, supercontinuum and terahertz wave generation.
Author(s)
Chambonneau, Maxime
Friedrich-Schiller-Universität Jena
Blothe, Markus
Friedrich-Schiller-Universität Jena
Fedorov, Vladimir Yu.
Université Jean Monnet
Kernier, Isaure de
First Light Imaging SAS
Tzortzakis, Stelios
Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas
Nolte, Stefan  
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Journal
Nature Communications  
Open Access
File(s)
Download (2.42 MB)
Rights
CC BY 4.0: Creative Commons Attribution
DOI
10.1038/s41467-026-69530-w
10.24406/publica-7803
Additional link
Full text
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
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