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  4. Control of the residual doping of InAs/(GaIn)Sb infrared superlattices
 
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2000
Journal Article
Title

Control of the residual doping of InAs/(GaIn)Sb infrared superlattices

Other Title
Kontrolle der Hintergrunddotierung von InAs/(GaIn)Sb Infrarot-Übergittern
Abstract
Magnetotransport and photoluminescence (PL) measurements on InAs/(Galn)Sb superlattices (SLs) .grown by molecular-beam epitaxy on GaSb substrates at different substrate temperatures are reported. With increasing growth temperature, a transition of the SLs from residual n-type to residual p-type doping was observed. For n-type samples, a decrease in the electron concentration leads to a strong increase in the PL intensity. In contrast, the PL intensity of p-type samples is only weakly dependent on the hole concentration. This correlation can be used to control the residual doping of the SLs.
Author(s)
Bürkle, L.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Fuchs, F.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Schmitz, J.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Pletschen, Wilfried  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Journal
Applied Physics Letters  
DOI
10.1063/1.1310167
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • InAs/(GaIn)Sb superlattice

  • InAs/(GaIn)Sb Übergitter

  • infrared detector

  • Infrarotdetektor

  • background doping

  • Hintergrunddotierung

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